Maud characteristics

• Written in Java can run on Windows, MacOSX, Linux, Unix (need Java VM 1.4 or later)
• Easy to use, every action is controlled by a GUI
• Works with X-ray, synchrotron, Neutron, TOF
• Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported
• Ab-initio structure solution integration, from peak finding, indexing to solving
• Different optimization algorithms available (LS, Evolutionary, Simulated Annealing, Metadynamics)
• Le Bail fitting
• Quantitative phase analysis
• Microstructure analysis (size-strain, anisotropy and distributions included)
• Texture and residual stress analysis using part or full spectra
• MEM algorithm for Electron Density Maps and fitting
• Thin film and multilayer aware; film thickness and absorption models
• Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation
• Several data files input formats
• Works and input images from 2D detectors (image plates, CCD)
• CIF compliance for input/output; import structures from databases

Application examples with Maud

I selected some of my presentations (and posters) and exported in PDF for downloading and viewing. There are several examples of Maud analyses in different fields. You may find some material duplicated in different slides. Few of them are partly in italian, because were presented in Italy to italian obviously. But the same material may be distributed in other presentations as well and for sure the figures are international!

Posters (A0 size):

IUcr 2005, Firenze, Italy, Algorithms for Crystal Structure Solving using Texture

IUcr 2005, Firenze, Italy, Crystal Structure and Texture Refinement of Polymers from Diffraction Images

Prague 2005, Structural and mechanical characterization of oriented polypropylene (fibers and woven nonwoven fabrics), be carefull is a big file (>16 Mb) or just an extract from the poster with only the diffraction analyses: Polypropylene Imaging Plate analysis

Presentations:

Caen school on Rietveld combined analysis 2005, France, not everything was presented but usefull to have, Combined Analysis: Introduction, Rietveld combined analysis: examples, About quantitative phase and size-strain analysis, Residual Stress Analysis

PPXRD 2005, Barcelona, Spain, Rietveld structural and microstructural characterization of pharmaceutical products using the program Maud

SISN 2005, Sirolo, Italy, Analisi della tessitura nei materiali tramite diffrazione neutronica

Universita' di Modena e Reggio Emilia, X-ray lab. 2005, Modena, Italy, Analisi della tessitura nei materiali e film sottili, but you need two additional parts that will be recalled inside the main presentation: Metalli-compositi.pdf, Film-polimeri.pdf

EMRS 2003, Strasbourg, France, Texture, residual stress and structural analysis of thin films using a combined X-ray analysis

LANSCE 2003, Los alamos, NM, Rietveld analysis with Maud: the absorption case and Hippo

LANSCE 2002, Los alamos, NM, Rietveld Texture Analysis: theory and new developments

ECM 2000, Nancy, France, Maud: a Rietveld analysis program designed for the internet and experiment integration

I like to thanks all the people who contributed to the work in the presentations, even if in some of them, for presentation reasons (was it a project meeting or an invitation to speak in one institution) I appear alone. So here is an incomplete list of people with whom I had or still have the pleasure to work. Not in a particular order:
H.-R. Wenk and S. Matthies, J. Pehl, Univ. Cal. at Berkeley, CA
S. Gialanella, R. Di Maggio, L. Cont, A. Pegoretti, T. Ricco, A. Pedrotti, L. Fambri, L. Cont, M. Bortolotti, G. Ischia, I. Lonardelli, R. Ceccato, R. Dal Maschio and many others, Univ. Trento, Italy
G. Artioli, M. Dugnani, M. Dapiaggi, Univ. Milano, Italy
D. Chateigner, M. Magali, CRISMAT-ENSICAEN, Caen, Fr
The ESQUI group (MDM Agrate Milano, LPEC Le Mans, CSIC Madrid), in particular S. Ferrari, A. Gibaud and J. Ricote (one for each).
T. Hansen, ILL, Fr
W. A. Kockelmann, ISIS, UK
K. Bennett, S. Vogel, H. Volz, CMS - LANL, Los alamos, NM
All people at Italstructures, Italy
L. Cranswick, NRC, Canada
M. Ferrari, Ohio State Univ., Columbus, Ohio.
L. Magarotto, Trieste, Italy.
All the others that for sure I forgot but you will find in my publications or who have invite me for such presentations.

Download some picture preview of the program in action (old version 1.99x):